Time-varying tip-sample force measurements and steady-state dynamics in tapping-mode atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Harnessing bifurcations in tapping-mode atomic force microscopy to calibrate time-varying tip-sample force measurements.
Torsional harmonic cantilevers allow measurement of time-varying tip-sample forces in tapping-mode atomic force microscopy. Accuracy of these force measurements is important for quantitative nanomechanical measurements. Here we demonstrate a method to convert the torsional deflection signals into a calibrated force wave form with the use of nonlinear dynamical response of the tapping cantilever...
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Quantifying the tip-sample interaction forces in amplitude-modulated atomic force microscopy (AM-AFM) has been an elusive yet important goal in nanoscale imaging, manipulation and spectroscopy using the AFM. In this paper we present a general theory for the reconstruction of tip-sample interaction forces using integral equations for AM-AFM and Chebyshev polynomial expansions. This allows us to ...
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In tapping-mode atomic force microscopy, nonlinear e¤ects due to large variations in the force ...eld on the probe tip over very small length scales and the intermittency of contact may induce strong dynamical instabilities. In this paper, a discontinuity-mapping-based analysis is employed to investigate the destabilizing e¤ects of low-velocity contact on a lumped-mass model of an oscillating a...
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The periodic impact force induced by the tip–sample contact in tapping mode atomic force microscopy (TM-AFM) gives rise to anharmonic oscillations of the sensing cantilever. These anharmonic signals can be understood with a model which goes beyond the common Hookian approximation: the cantilever is described as a multiple degree of freedom system. A theoretical analysis of the anharmonic signal...
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ژورنال
عنوان ژورنال: Physical Review B
سال: 2008
ISSN: 1098-0121,1550-235X
DOI: 10.1103/physrevb.77.115405